I obtained my Ph.D. in Physical Chemistry in May 1988 from the University of Ottawa under the guidance of Dr. Barry Morrow. Infrared and Raman spectroscopy were used to probe and identify surface species formed during the adsorption of gaseous molecules on metal oxide catalysts.

In 1986, prior to completing my Ph.D., I joined Bomem Inc., a world leader in the design and manufacture of Fourier transform spectrometers, as an Applications Specialist and after a year, was promoted to Applications Manager. During my two-year tenure with Bomem, I gained a detailed knowledge of the inner workings and design of spectrometers, and was exposed to a myriad of applications covering the vacuum UV to the far IR spectral range. Major accomplishments included the development of the first commercial FT-Raman spectrometer and the first mid-IR polarizing Michelson interferometer.

In July 1988, I joined the Exploratory Surface Chemistry group at the Xerox Research Center of Canada. I instituted a research plan that capitalized on the combined experience and training acquired during my graduate studies and my tenure at Bomem. The emphasis of the work was on developing novel optical spectroscopic techniques for surface chemical analysis or materials. The goal was to use knowledge gained from these fundamental studies to develop an understanding of the relationship between the molecular chemistry and macroscopic properties of interest to imaging technologies.

In September 1994, I transferred to a management position in the Materials Characterization area at Xerox. There were six research scientists in this area and our mandate was to provide characterization support to centre projects and to conduct research within our respective disciplines. The main areas of activity were centered on the use of NMR (400 and 300 MHz), ESR, SEM, TEM, XRD, AFM, rheology, and IR/Raman spectroscopy.